MCP3008

Microchip MCP3008 8-channel 10-bit SAR ADC with SPI interface (single-ended and differential).

Live catalog

Prefer labwired_describe with the catalog id over guessing pins or addresses.

Status at a glance

Aspect	Status
Catalog id	`mcp3008`
Bus	SPI (mode 0,0 or 1,1)
Address	— (CS via `cs_pin`)
Datasheet	Microchip MCP3004/3008 DS21295D: §5.0, Table 5-2, Equation 4-2, §6.1 Figure 6-1
Source	`configs/devices/mcp3008.yaml` (declarative, no Rust model)
Tier	smoke-proven (register-level tests: `crates/core/tests/parts_batch5.rs`)

Pin / net	Role
SCK / DIN / DOUT	SPI
CS/SHDN	`cs_pin`
CH0..CH7	Analog inputs (stimulus `ch0_mv`..`ch7_mv`)
VREF	Stimulus `vref_mv`

Behavior	Status	Notes
Figure 6-1 three-byte read (0x01, SGL·D2D1D0, x)	✅	Null bit + B9:B8 in byte 1, B7..B0 in byte 2
Single-ended CH0..CH7, differential pairs (Table 5-2)	✅	Negative difference reads 0
code = 1024·VIN/VREF, clamp 0..1023	✅
LSB-first repeat after B0, then zeros	✅
Other start-bit alignments, sample/conversion timing	❌

Host inputs: ch0_mv … ch7_mv, vref_mv (millivolts).

Place the part and an MCU in Playground, or add it to a system YAML:

external_devices:
  - id: "mcp3008"
    type: "mcp3008"
    connection: "spi1"
    config:
      cs_pin: "PA4"

Agent: labwired_list → labwired_describe id=mcp3008 → wire → labwired_validate → labwired_run / labwired_verify.
Register-level smoke: cargo test -p labwired-core --test parts_batch5 — CH0 → 512, CH5 → 310, CH0−CH1 differential → 256, and the clamp; mcp3008_tracks_stimulus_vref_and_lsb_first_repeat covers VREF, full scale and the LSB-first repeat. The same file's negative control proves the check fails against a stand-in that answers only 0x00 or only 0xFF.

The start bit must be bit 0 of the first byte (Figure 6-1); the 0x18 | ch five-bit form returns zeros.
Inputs are integer millivolts; the result is the ideal transfer function.

See the YAML header for the full datasheet trace and every named approximation.